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X-ray: Discovering DRAM Internal Structure and Error Characteristics by Issuing Memory Commands. (arXiv:2306.03366v1 [cs.CR])
cs.CR updates on arXiv.org arxiv.org
The demand for accurate information about the internal structure and
characteristics of dynamic random-access memory (DRAM) has been on the rise.
Recent studies have explored the structure and characteristics of DRAM to
improve processing in memory, enhance reliability, and mitigate a vulnerability
known as rowhammer. However, DRAM manufacturers only disclose limited
information through official documents, making it difficult to find specific
information about actual DRAM devices.
This paper presents reliable findings on the internal structure and
characteristics of DRAM using …
access demand dram dynamic error information internal memory random reliability rowhammer studies vulnerability