April 11, 2022, 1:20 a.m. | Pantea Kiaei, Zhenyuan Liu, Patrick Schaumont

cs.CR updates on arXiv.org arxiv.org

Pre-silicon side-channel leakage assessment is a useful tool to identify
hardware vulnerabilities at design time, but it requires many high-resolution
power traces and increases the power simulation cost of the design. By
downsampling and averaging these high-resolution traces, we show that the power
simulation cost can be considerably reduced without significant loss of
side-channel leakage assessment quality. We introduce a theoretical basis for
our claims. Our results demonstrate up to 6.5-fold power-simulation speed
improvement on a gate-level side-channel leakage assessment …

ar assessment channel side-channel silicon

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