Infra-Red, In-Situ (IRIS) Inspection of Silicon. (arXiv:2303.07406v1 [cs.AR])

This paper introduces the Infra-Red, In Situ (IRIS) inspection method, which
uses short-wave IR (SWIR) light to non-destructively "see through" the backside
of chips and image them with lightly modified conventional digital CMOS
cameras. With a ~1050 nm light source, IRIS is capable of constraining macro-
and meso-scale features of a chip. This hardens existing micro-scale self-test
verification techniques by ruling out the existence of extra circuitry that can
hide a hardware trojan with a test bypass. Thus, self-test techniques …

cameras chip chips cmos digital features hardware hide infra macro micro non scale silicon techniques test verification