Web: https://web.nvd.nist.gov/view/vuln/detail?vulnId=CVE-2022-25654

Sept. 16, 2022, 6:15 a.m. |

National Vulnerability Database nist.gov

Memory corruption in kernel due to improper input validation while processing ION commands in Snapdragon Auto, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Wearables

cve

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