Web: https://web.nvd.nist.gov/view/vuln/detail?vulnId=CVE-2022-22105

Sept. 16, 2022, 6:15 a.m. |

National Vulnerability Database nist.gov

Memory corruption in bluetooth due to integer overflow while processing HFP-UNIT profile in Snapdragon Auto, Snapdragon Consumer IOT, Snapdragon Mobile, Snapdragon Voice & Music

cve

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