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Counterfeit Chip Detection using Scattering Parameter Analysis. (arXiv:2302.11034v1 [cs.CR])
cs.CR updates on arXiv.org arxiv.org
The increase in the number of counterfeit and recycled microelectronic chips
in recent years has created significant security and safety concerns in various
applications. Hence, detecting such counterfeit chips in electronic systems is
critical before deployment in the field. Unfortunately, the conventional
verification tools using physical inspection and side-channel methods are
costly, unscalable, error-prone, and often incompatible with legacy systems.
This paper introduces a generic non-invasive and low-cost counterfeit chip
detection based on characterizing the impedance of the system's power …
analysis applications channel chip chips cost counterfeit critical deployment detection error legacy legacy systems low microelectronic non parameter physical safety security side-channel systems tools verification