On the impact of ionizing and non-ionizing irradiation damage on security microcontrollers in CMOS technology

ePrint Report: On the impact of ionizing and non-ionizing irradiation damage on security microcontrollers in CMOS technology

Theresa Krüger

The possible effects of irradiation on security controllers implemented in CMOS technology are studied. First, the decrease of the effectiveness of a light sensor/detector as countermeasure against laser fault injection is analysed. Second, the use of irradiation as fault injection method is proposed.

cmos controllers detector eprint report impact light sensor microcontrollers non report security sensor technology theresa